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March 2010 SEMATECH Surface Preparation and Cleaning Conference "Charge-Induced Attraction of Particles in Surface Preparation and Clean Processes" by Y. Yamada, H. Eda, M. Kodera, M. Tamaoki, A. Shimazaki of Toshiba Corporation; W. Usry, R. Newcomb of Qcept Technologies October 2009 EuroAsia Semiconductor Issue VI 2009 "New Eyes for Advanced Processes," Issue VI 2009: 19-22 by R. Spicer of Qcept Technologies August 2009 Solid-State Technology "Non-visual Defect Inspection for Comprehensive Yield Management " by R. Spicer of Qcept Technologies August 2009 Semiconductor International "Defect Detection Drives to Greater Depths" by Ruth DeJule, Contributing Editor -- Semiconductor International June 2009 ASMC 2009 "A New Surface Analysis Method for Semiconductor Manufacturing based on Surface-Potential by R. Schuetten, M. Kleber, M. Jerenz, I. Gregorius, B. Zimmermann, R. Kaesmaier, of Qimonda Dresden GmbH & Co OHG; R. Newcomb, J. Hickson, N. Tamayo of Qcept Technologies June 2009 ASMC 2009 "Novel In-line Inspection Method for Non-visual Defects and Charging " by K. Hoppner, R. Manuwald, T. Fahr, E. Zschech of Advanced Micro Devices; J. Hickson, N. Tamayo, R. Newcomb of Qcept Technologies May 2009 Frontiers of Characterization and Metrology for Nanoelectronics - Albany, NY "VOC & Metallic Contaminant Control For by R. Brun, C. Moulin, C. Girard of Soitec and March 2009 SPCC 2009 - Austin, TX "Optimization of Edge Clean Using Non-visual Defect Inspection " by L. Gabette and A. Danel of CEA-LETI, Minatec, P. Besson of ST Microelectronics, R. Spicer, B. Usry, D. Peters, R. Newcomb of Qcept Technologies March 2009 Semiconductor International "Controlling Process-Induced Charging Heightens Productivity" by R. Spicer, J. Hawthorne, D. Peters, R. Newcomb of Qcept Technologies April 2008 April 2008 SPCC 2008- Austin, TX April 2008 April 2008 "Full-Wafer Post-Via Wet Clean Non-Visual Defect Inspection" Contributors - D. Scranton, J. Bryer, Semitool, Inc., Kalispell, MT and R. Newcomb, B. Usry, Qcept Technologies October 2007 Advanced Substrate News September 2006 UCPSS 2006 Contributors- R. Bryant, J. Hawthorne, J. Hickson of Qcept Technologies February 2005 MICRO Magazine Contributors- D. Maloney and K. Ip of DuPont EKC Technology, D. Sowell of Intellimetrics, Inc. and C. Yang, J. Hawthorne, B. Steele, R. Bryant of Qcept Technologies |
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