The Qcept™ ChemetriQ® Family

To overcome the limitations of optical inspection and metrology, the industry needs a production-speed technology that provides full-wafer, sub-monolayer sensitivity, and high-resolution mapping of wafer surface contamination and film non-uniformity that lower yield.

To meet this challenge, Qcept’s ChemetriQ family of inspection tools enable customers to improve yield and thereby increase fab profitability. Qcept's flagship inspection tool is the ChemetriQ® 3000 Inspection System for high-volume, advanced fabs.