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July 2008

Solid State Technology

"Qcept gets a visual on defects "

by Debra Vogler

Video interview with Erik C. Smith, Qcept President & COO, at MCA press reception, SEMICON West 2008.

July 2008

WaferNEWS, Solid State Technology

"Charge Signature Flags Non-Visual Defects "
by Kathrine Derbyshire

Interview with Erik C. Smith, Qcept President & COO, at SEMICON West 2008.

April 2008

Semiconductor International

"The Donut Mystery"
by David Lammers

Blog covering John Halladay's presentation of Qcept's ChemetriQ® 3000 results for Spansion's Fab 25 at SPCC 2008.

April 2008
Solid State Technology
"Full-Wafer Post-Via Wet Clean Non-Visual Defect Inspection"
Contributors- Dana Scranton, Jim Bryer, Semitool, Kalispell, MT and Robert Newcomb and Bill Usry of Qcept Technologies.

April 2008
SPCC 2008- Austin, TX
"Elimination of ESD Defects Using DICO2"
Contributors- John Halladay, Joohwan Yoo, Kinsang Lam, Jeremy Lansford and Bill Brennan of Spansion Fab 25, Barbara Teeter of SEZ America, Robert Newcomb and Bill Usry of Qcept Technologies.

April 2008

SPCC 2008- Austin, TX
"Imaging of Contamination on Wafers Using a Scanning Surface Potential Difference Measurement Technique"
Contributors- A. Danel, J.P. Barnes, S. Sage of CEA-LETI, MINATEC, R. Bryant,

R. Newcomb and R. Spicer of Qcept Technologies

April 2008
SPCC 2008- Austin, TX
"Optimization of a Post Via Etch Wet Clean Process Using a Novel, Full-Wafer Inspection Technique for Non-Visual Defects"
Contributors - Dana Scranton and Jim Byer of Semitool, Robert Newcomb and Bill Usry of Qcept Technologies Inc.

January 2008
Semiconductor International
Executive Outlook: "Driving Productivity"
Contributor - Erik Smith, President & COO, Qcept Technologies Inc.

October 2007

Advanced Substrate News
"Non-Optical Inspection Technology Detects the Unseen" written by Robert Newcomb, VP Business Development. 

May 2005
Qcept Technologies Named 2005 Winner of Emerging Business Category at AeA's Southeast Spirit of Endeavor Awards.

Jan/Feb 2005
MICRO

"Inspecting Wafers Using a Potential Difference Imaging Sensor Method"

Contributors - Chris Yang, Jeff Hawthorne, Brandon Steele, Robert Bryant of Qcept Technologies Inc., David Sowell of Intellimetrics, David Maloney and Katy Ip of DuPont/EKC Technology.
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