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2010

Qcept received an additional U.S. patent: U.S. Patent No. 7,659,734 issued February 9, 2010.

2009

Qcept was awarded 2009 Editors' Choice Best Product award by Semiconductor International at Semicon West.

Qcept received two European patents:  Patent No. EP 1 711 801 granted June 17, 2009 and EP 1 869 436 granted October 7, 2009. 

Qcept received a patent in Taiwan:  R.O.C. Invention Patent No. I317809 issued December 1, 2009.

Qcept received Certificate of Registration for the mark Qcept® assigned U.S. Trademark Registration number 3669660 on August 18, 2009.

2008

Qcept received two additional U.S. patents: U.S. Patent No. 7,337,076 issued February 26, 2008 and U.S. Patent No. 7,379,826 issued May 27, 2008.

2007

Qcept received two additional U.S. patents: U.S. Patent No. 7,308,367 issued December 11, 2007, U.S. Patent No. RE 39,803 issued September 4, 2007.

2006

Qcept received four additional U.S. patents: U.S. Patent No. 7,092,826 issued August 15, 2006, U.S. Patent No. 7,103,482 issued September 5, 2006, U.S. Patent No. 7,107,158 issued September 12, 2006 and U.S. Patent No. 7,152,476 issued December 26, 2006.

Qcept received Certificate of Registration for the mark ChemetriQ® assigned U.S. Trademark Registration number 3,118,703 on July 26, 2006.

2005

Qcept issued first U.S. Patent No. 6,957,154 October 18, 2005. 

Qcept developed ChemetriQ® family of inspection tools including the flagship ChemetriQ-3000 Wafer Inspection System.