 Our ChemetriQ® inspection systems enable fabs to improve yield by detecting
Non-Visual Defects (NVD), sub-monolayer metallic and organic contamination,
and other yield-killing surface non-uniformities that cannot be seen by optical
tools. Whether you’re in a high-volume, advanced fab, in pilot production, development or a research lab, there's a ChemetriQ tool that will enable you to improve yield and increase fab profitability.
July 2010 EE Times Video Interview at Semicon West with Ralph Spicer, VP Marketing of Qcept July 2010 ElectroIQ Blog (Solid State Technology) July 2010 R&D Magazine Next-generation NVD Inspection Solution for Patterned Wafers. July 2010 PC's Semiconductors Blog Qcept Technologies Intros Next-Generation NVD Inspection Solution for Patterned Wafers. March 2010 SEMATECH Surface Preparation and Cleaning Conference "Charge-Induced Attraction of Particles in Surface Preparation and Clean Processes" October 2009 EuroAsia Semiconductor Issue VI 2009 "New Eyes for Advanced Processes," August 2009 Solid-State Technology "Non-visual Defect Inspection for Comprehensive Yield Management " August 2009 Semiconductor International "Defect Detection Drives to Greater Depths" March 2009 Semiconductor International "Controlling Process-Induced Charging Heightens Productivity"
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UCPSS 2010September 19-22, 2010
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