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Our ChemetriQ® inspection systems enable fabs to improve yield by detecting Non-Visual Defects (NVD), sub-monolayer metallic and organic contamination, and other yield-killing surface non-uniformities that cannot be seen by optical tools.

Whether you’re in a high-volume, advanced fab, in pilot production, development or a research lab, there's a ChemetriQ tool that will enable you to improve yield and increase fab profitability.

In The News

July 2010

EE Times Video Interview at Semicon West with Ralph Spicer, VP Marketing of Qcept

Mark LaPedus, EE Times, interviews Ralph Spicer at Semicon West 2010.  Discussion around Non-Visual Defect (NVD) Inspection.

July 2010

ElectroIQ Blog (Solid State Technology)

"Qcept Technologies for Detecting Submonolayer Non-Visual Defects (NVD) in Semiconductor Wafers"  Podcast with Ralph Spicer, VP Marketing at Qcept Technologies"

July 2010

R&D Magazine

Next-generation NVD Inspection Solution for Patterned Wafers.

July 2010

PC's Semiconductors Blog

Qcept Technologies Intros Next-Generation NVD Inspection Solution for Patterned Wafers.

March 2010

SEMATECH Surface Preparation and Cleaning Conference

"Charge-Induced Attraction of Particles in Surface Preparation and Clean Processes"

October 2009

EuroAsia Semiconductor

Issue VI 2009

"New Eyes for Advanced Processes,"

Issue VI 2009: 19-22

August 2009

Solid-State Technology

"Non-visual Defect Inspection for Comprehensive Yield Management "

August 2009

Semiconductor International

"Defect Detection Drives to Greater Depths"

March 2009

Semiconductor International

"Controlling Process-Induced Charging Heightens Productivity"

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ChemetriQ® NVD
Inspection System Awarded Semiconductor International Editors' Choice Best Product Award for 2009

      

 

Upcoming Events

UCPSS 2010

September 19-22, 2010
Ostend, Belgium

Qcept is proud to be a major sponsor of the 10th International Symposium on Ultra Clean Processing of Semiconductor Surfaces, a world class forum on the topics of wafer cleaning, clean processing and related metrology.   Come visit us in Booth A-4!

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Product Spotlight

Qcept Introduces the ChemetriQ® 5000 NVD Inspection System for Patterned Wafers (7/6/10)

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Press Releases

July 6, 2010

Qcept Technologies Introduces Next-Generation NVD Inspection Solution for Patterned Wafers

April 13, 2010

Qcept Technologies Secures $10.4 Million in Funding

March 10, 2009
Leading Memory IC Manufacturer Evaluates Qcept Technologies' NVD Inspection Solution for Sub-40-NM Applications 

- Japanese translation

- Korean translation

December 4, 2008
Soitec Adopts Qcept Technologies' NVD Inspection Solution for Silicon-on-Insulator Wafer Production Applications

- Japanese translation

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