Our ChemetriQ® inspection systems enable fabs to improve yield by detecting Non-Visual Defects (NVD), sub-monolayer metallic and organic contamination, and other yield-killing surface non-uniformities that cannot be seen by optical tools.

October 2009

EuroAsia Semiconductor

Issue VI 2009

"New Eyes for Advanced Processes,"

Issue VI 2009: 19-22

August 2009

Solid-State Technology

"Non-visual Defect Inspection for Comprehensive Yield Management "

August 2009

Semiconductor International

"Defect Detection Drives to Greater Depths"

March 2009

Semiconductor International

"Controlling Process-Induced Charging Heightens Productivity"

ChemetriQ® 3000 NVD    Inspection System Awarded  Semiconductor International  2009 Editors' Choice Best  Product Award

SEMATECH Surface Preparation and Cleaning Conference

March 22-24, 2010
Austin, Texas

The SEMATECH Surface Preparation and Cleaning Conference (SPCC) is an annual event which brings together prominent researchers from the semiconductor industry and the university community to focus on the current developments and ITRS challenges in advanced wafer and mask cleaning and surface preparation technologies for the 22nm node and beyond.

ChemetriQ® Series Wafer Inspection Systems

Whether you’re in a high-volume, advanced fab, in pilot production, development or a research lab, there's a ChemetriQ tool that will enable you to improve yield and increase fab profitability.

March 10, 2009
Leading Memory IC Manufacturer Evaluates Qcept Technologies' NVD Inspection Solution for Sub-40-NM Applications 

- Japanese translation

- Korean translation

December 4, 2008
Soitec Adopts Qcept Technologies' NVD Inspection Solution for Silicon-on-Insulator Wafer Production Applications

- Japanese translation